US Patent Issued to Waviks on July 7 for "Optical probe system for the electron microscope" (Texas Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,282, issued on July 7, was assigned to Waviks Inc. (Dallas).

"Optical probe system for the electron microscope" was invented by Thomas M. Moore (Dallas), Benjamin Wolf (Dallas) and Gonzalo Amador (Dallas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical probe system and a microscope system. The optical probe system includes an optical probe with an optical probe shaft configured to extend at least partially into a vacuum chamber of a charged particle beam microscope. A first and second optical channel can extend through the optical probe shaft. The first optical channel accommodates a portion of a segmented optical axis, and the second optica...