ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,588, issued on June 9, was assigned to Washington University (St. Louis).
"Multi-view reflector microscope" was invented by Matthew Lew (St. Louis) and Oumeng Zhang (St. Louis).
According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging system uses a multi-view reflector (MVR) to simultaneously measure the three-dimensional (3D) position and orientation of a light emitter. The MVR is positioned at a back focal plane (BFP) of a light collecting optical system, and uses pyramid reflectors and/or conical reflectors to reflect light in at least two regions of the BFP to at least two detection channels of a detector. The at least two detection channels produ...