US Patent Issued to ViewRay Systems on Feb. 17 for "Relative electron density mapping from magnetic resonance imaging" (American, Bulgarian Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,972, issued on Feb. 17, was assigned to ViewRay Systems Inc. (Denver).

"Relative electron density mapping from magnetic resonance imaging" was invented by James F. Dempsey (Pebble Beach, Calif.) and Iwan Kawrykow (Sofia, Bulgaria).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are systems, computer software, and methods for generating a relative electron density map (RED) from a magnetic resonance imaging (MRI) scan. This can include obtaining an MRI scan of a portion of a patient and segmenting a first region and a second region in the MRI scan. A RED map can then be generated from the MRI scan by assigning a first RED to the first region,...