ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,889, issued on March 31, was assigned to VIAVI Solutions Inc. (Chandler, Ariz.).

"Outlier detection for spectroscopic classification" was invented by Chang Meng Hsiung (Redwood City, Calif.) and Lan Sun (Santa Rosa, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a device may determine that an unknown sample is an outlier sample by using an aggregated classification model. The device may determine that one or more spectroscopic measurements are not performed accurately based on determining that the unknown sample is the outlier sample. The device may cause one or more actions based on determining the one or more spect...