ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,287, issued on Jan. 20, was assigned to VERKOR (Grenoble, France).
"Apparatus and method for inspecting a secondary cell" was invented by Delphine Vidal (Grenoble, France), Drew Heilman (Grenoble, France) and Jeong Hyun Kim (Grenoble, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus for inspecting at least one secondary cell includes a fixed support part; a movable part; and pressing parts that are installed between the support part and the movable part. The pressing parts are freely movable along the main axis, two adjacent pressing parts defining a space (120) for accommodating a secondary cell. Each pressing part that...