US Patent Issued to Veeva Systems on March 3 for "Error parameter generation and utilization for data projections in a computing storage network" (American, Canadian Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,688, issued on March 3, was assigned to Veeva Systems Inc. (Pleasanton, Calif.).

"Error parameter generation and utilization for data projections in a computing storage network" was invented by Bryan Wayne Johnson (Brookline, Mass.), Myrto M. Miltiadous (New York), Christopher George Glazner (New York), Eshaan Ghosh (Milton, Canada), Colin O'Laughlin (Brooklyn, N.Y.) and Vasile Iulian Ilies (Boston).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosed methods include: generating first projected data, second projected data, and third projected; determining or estimating an error parameter associated with the first projected data, the second pr...