ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,853, issued on Feb. 17, was assigned to Vanderbilt University (Nashville, Tenn.).
"Methods of characterizing two-dimensional materials, devices comprising said materials and methods of making and use thereof" was invented by Piran R. Kidambi (Nashville, Tenn.), Nicole Moehring (Nashville, Tenn.) and Pavan Chaturvedi (Nashville, Tenn.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are methods of characterizing two-dimensional materials, devices comprising said materials and methods of making and use thereof. For example, disclosed herein are methods for characterizing pore(s) and/or defect(s) in a two-dimensional (2D) material, compr...