ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,758, issued on April 14, was assigned to UT-Battelle LLC (Oak Ridge, Tenn.).
"Building leakage detector using reference-free background oriented schlieren photography" was invented by Philip R. Boudreaux (Knoxville, Tenn.), Singanallur Vaidyanathan Venkatakrishnan (Knoxville, Tenn.), Emishaw D. Iffa (Knoxville, Tenn.), Diana E. Hun (Lenoir City, Tenn.), William Powell Partridge Jr. (Oak Ridge, Tenn.), Gurneesh Singh Jatana (Knoxville, Tenn.) and Rui Zhang (Oak Ridge, Tenn.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A non-invasive technique to measure exfiltration and infiltration (leakage) in buildings including a system and method employing RF...