US Patent Issued to University of Pittsburgh-Of the Commonwealth System of Higher Education on March 3 for "Automated nanoscopy system having integrated artifact minimization modules, including embedded nanometer position tracking based on phasor analysis" (Pennsylvania Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,268, issued on March 3, was assigned to University of Pittsburgh-Of the Commonwealth System of Higher Education (Pittsburgh).

"Automated nanoscopy system having integrated artifact minimization modules, including embedded nanometer position tracking based on phasor analysis" was invented by Hongqiang Ma (Pittsburgh) and Yang Liu (Sewickley, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of compensating for focus drift in a microscopy system includes receiving data representing a reference light signal reflected from a sample and received by an image sensor, identifying from the data a peak of the reference light signal, the peak having ...