US Patent Issued to Universiteit Twente on July 21 for "Material characterization method" (Dutch Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,685,480, issued on July 21, was assigned to Universiteit Twente (Enschede, Netherlands).

"Material characterization method" was invented by David Fernandez Rivas (Enschede, Netherlands) and Miguel Angel Quetzeri Santiago (Enschede, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention provides a method for determining a property of a target area of a material, wherein the target area has a size selected from the range of 100 micro metre2-100 mm2, wherein the method comprises: an exposure stage comprising providing a liquid jet to the target area, wherein the liquid jet has a jet velocity selected from the range of 2-150 m/s; a measure...