US Patent Issued to UNIVERSITE GUSTAVE EIFFEL on Aug. 11 for "Method and device for measuring the state of health of semiconductor-based electronic components" (French Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,540, issued on Aug. 11, was assigned to UNIVERSITE GUSTAVE EIFFEL (Champs sur Marne, France).

"Method and device for measuring the state of health of semiconductor-based electronic components" was invented by Zoubir Khatir (Le Plessis Robinson, France), Richard Lallemand (Paris) and Ali Ibrahim (Fontenay le Fleury, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring the state of health, of at least one semiconductor-based power electronics, comprising: a-determining, at an initial time t0, a first current value I(t0)=I,ZCP0 when the voltage V is equal to a voltage V(t0)=V,ZCP0, the power electronics component then being in a...