US Patent Issued to UNITEST on April 14 for "Probe card holder for wafer testing" (South Korean Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,782, issued on April 14, was assigned to UNITEST INC (Yongin-si, South Korea).

"Probe card holder for wafer testing" was invented by Dae Kyoung Kim (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Proposed is a probe card holder for wafer testing including a first body part (110) provided with a probe card (111) and through guide holes (112) vertically formed around the probe card (111), a second body part (120) provided with a wafer chuck (121) on which a wafer is seated and a magnet holder (122) corresponding to the guide hole (112), a weight ring (130) provided with a magnet chuck (131) that is inserted into the guide hole ...