US Patent Issued to United States of America as Represented by the Administrator of NASA on Aug. 18 for "Automated testing and characterization of additive manufacturing" (California, New York Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,739, issued on Aug. 18, was assigned to United States of America as Represented by the Administrator of NASA (Washington).

"Automated testing and characterization of additive manufacturing" was invented by Arash Mazhari (San Jose, Calif.), Rachel Lackritz Ticknor (Cupertino, Calif.), Daniel Walton Cellucci (Ithaca, N.Y.), Stanley Marcus Krzesniak (Mountain View, Calif.), Sean Shan-Min Swei (Gilroy, Calif.) and Dean Peter Giovannetti (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system method for characterizing an additive manufacturing (AM) machine or feedstock material of the AM machine include using the AM machine to generate ...