US Patent Issued to UNITED MICROELECTRONICS on March 24 for "Method for physically unclonable function through gate height tuning" (Taiwanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,588,194, issued on March 24, was assigned to UNITED MICROELECTRONICS CORP. (Hsin-Chu City, Taiwan).

"Method for physically unclonable function through gate height tuning" was invented by Chang-Yih Chen (Tainan, Taiwan), Yi-Wen Chen (Chiayi County, Taiwan) and Wei-Chung Sun (Tainan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for physically unclonable function through gate height tuning is provided in the present invention, including steps of forming a high-k dielectric layer and a dummy silicon layer on a semiconductor substrate, removing the dummy silicon layer, forming a work function layer and a metal filling layer on the high-k d...