US Patent Issued to UNITED MICROELECTRONICS on Aug. 4 for "Autonomous evaluation method and autonomous evaluation device for semiconductor smart manufacturing" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,378, issued on Aug. 4, was assigned to UNITED MICROELECTRONICS CORP. (Hsinchu, Taiwan).

"Autonomous evaluation method and autonomous evaluation device for semiconductor smart manufacturing" was invented by Yung-Chien Kung (Tainan City, Taiwan), Li-Hsin Yang (Tainan City, Taiwan), Chung-Hsien Wu (Hsinchu City, Taiwan) and Pang-Min Wang (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An autonomous evaluation method and an autonomous evaluation device for semiconductor smart manufacturing are provided. The autonomous evaluation method for the semiconductor smart manufacturing includes the following steps. For each of a plurality of ...