US Patent Issued to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY on Sept. 29 for "Automated and wireless accelerated heat treat life testing system" (South Korean, American Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,009, issued on Sept. 29, was assigned to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea).

"Automated and wireless accelerated heat treat life testing system" was invented by Pyungwoo Yeon (Santa Clara, Calif.) and Mingu Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an automated and wireless accelerated heat treat life testing system, and the system includes a readout coil; and an LC sensor on the readout coil, wherein the LC sensor includes: a sensing coil; an IDC sensor on the sensing coil; and a humidity sensing layer on a sensing area of the IDC sensor."

The patent was filed on ...