US Patent Issued to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY on Aug. 25 for "Apparatus and method for pre-analyzing memory fault information" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,717,672, issued on Aug. 25, was assigned to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea).

"Apparatus and method for pre-analyzing memory fault information" was invented by Sungho Kang (Seoul, South Korea) and Hayoung Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory fault information pre-analysis according to the present disclosure includes a fault monitor, a fault counter, a must monitor, and a fault address collector, the fault memory receives fault data configured by a row address and a column address of a memory and stores a location where fault information about the fault data is stored ...