ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,768, issued on April 21, was assigned to Tsinghua University (Haidian District, China) and NUCTECH COMPANY Ltd. (Haidian District, China).
"Radiographic inspection device and method of inspecting object" was invented by Zhiqiang Chen (Haidian District, China), Li Zhang (Haidian District, China), Yi Cheng (Haidian District, China), Qingping Huang (Haidian District, China), Mingzhi Hong (Haidian District, China), Minghua Qiu (Haidian District, China), Yao Zhang (Haidian District, China), Jianxue Yang (Haidian District, China) and Lei Zheng (Haidian District, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A radiographic inspection device and a m...