ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,944, issued on March 24, was assigned to TSE Co. LTD. (Chungcheongnam-do, South Korea).
"Test socket" was invented by Hae Guk Cho (Chungcheongnam-do, South Korea) and Yee Sun Kang (Chungcheongnam-do, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "The test socket according to the present disclosure is configured to bring terminals of a device under test into contact with electrode pads of a test board, that generates a test signal, to electrically connect the device under test and the tester, the contact part-module configured to allow the contact part to be in an aligned state is separatably coupled to an upper side of the second lower ...