ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,908, issued on June 2, was assigned to TSE Co. LTD. (Chungcheongnam-Do, South Korea).
"Test socket" was invented by Chang Su Oh (Cheonan-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket including: a testing probe including a lower plunger in contact with a pad; an upper plunger coupled to the lower plunger; a spring probe made of a cylindrical spring for applying elasticity to the lower plunger and the upper plunger; and a contact probe with an upper side contacting a terminal of a test device and a lower side contacting the upper plunger; a socket housing that provides housing holes and accommodates the contact probe and ...