US Patent Issued to TRIAD NATIONAL SECURITY on Sept. 22 for "Deep learning method for defect characterization" (New Mexico, Washington, Georgia, Michigan Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,630, issued on Sept. 22, was assigned to TRIAD NATIONAL SECURITY LLC (Los Alamos, N.M.).

"Deep learning method for defect characterization" was invented by Adam Joseph Wachtor (Santa Fe, N.M.), Eric Brian Flynn (Santa Fe, N.M.), Erica Marie Jacobson (Los Alamos, N.M.), Ian Thomas Cummings (Los Alamos, N.M.), Joshua David Eckels (Ann Arbor, Mich.), Isabel Faith Fernandez (Atlanta) and Kelly Ho (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system employing deep learning techniques improves processing speed and spatial resolution of acoustic wavenumber spectroscopy (ASSESS) techniques by performing semantic segmentation on simul...