ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,551,314, issued on Feb. 17, was assigned to TOPPAN PRINTING Co. Ltd. (Tokyo).
"Examination marker" was invented by Junya Tanabe (Tokyo), Ryohei Tode (Tokyo), Saeko Nomura (Tokyo), Tsukasa Yamazaki (Tokyo), Ryo Shoda (Tokyo) and Hiroyoshi Nishiyama (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An examination marker is used in diagnostic imaging using microwaves, including a marker body to be adhered to a site to be examined. The marker body is configured to display an index used for scanning of the site to be examined and to deform in accordance with a shape of the site to be examined, and the marker body has a transmittance of 70% or higher to m...