US Patent Issued to TOPCON on May 12 for "Slit lamp microscope" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,622,584, issued on May 12, was assigned to TOPCON Corp. (Tokyo).

"Slit lamp microscope" was invented by Hitoshi Shimizu (Tokyo), Kazuhiro Omori (Tokyo) and Hisashi Tsukada (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A slit lamp microscope according to an embodiment example includes a scanner, a first assessing processor, and a controller. The scanner is configured to perform application of a scan to an anterior segment of a subject's eye with slit light to collect an image group. The first assessing processor is configured to execute an assessment of a quality of the image group collected by the scanner. The controller is configured t...