US Patent Issued to TOPCON on July 14 for "Ophthalmologic apparatus and method of examining eye to be examined" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,042, issued on July 14, was assigned to TOPCON Corp. (Tokyo).

"Ophthalmologic apparatus and method of examining eye to be examined" was invented by Hiroaki Okada (Tokyo) and Yoko Tatara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ophthalmologic apparatus includes a first left eye measurement optical system for measurement of dimensional information in a front-back direction of a left eye, a second left eye measurement optical system for measurement of a corneal shape of the left eye, a third left eye measurement optical system for measurement of a refractive property of the left eye, a first right eye measurement optical system for meas...