US Patent Issued to TOPCON on April 7 for "Anterior segment analysis apparatus, anterior segment analysis method, and non-transitory computer-readable storage medium" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,144, issued on April 7, was assigned to TOPCON Corp. (Tokyo).

"Anterior segment analysis apparatus, anterior segment analysis method, and non-transitory computer-readable storage medium" was invented by Shigeru Honda (Tokyo) and Kazunori Asanuma (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An anterior segment analysis apparatus includes a control device configured to: obtain a tomographic image of an anterior segment including a cornea of a subject eye formed by OCT measurement; detect a plurality of edges included in the tomographic image; perform a first joining including joining between edges for each of the plurality of edges based on a...