US Patent Issued to TONGJI UNIVERSITY, NATIONAL INSTITUTE OF METROLOGY, CHINA on July 14 for "Methods and devices of 425NM wavelength reference construction based on fluorescence-induced effect" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,871, issued on July 14, was assigned to TONGJI UNIVERSITY (Shanghai) and NATIONAL INSTITUTE OF METROLOGY, CHINA (Beijing).

"Methods and devices of 425NM wavelength reference construction based on fluorescence-induced effect" was invented by Xinbin Cheng (Shanghai), Xiao Deng (Shanghai), Cong Yin (Beijing), Jianbo Wang (Beijing), Tongbao Li (Shanghai), Tong Zhou (Shanghai), Dongbai Xue (Shanghai), Guangxu Xiao (Shanghai), Junyu Shen (Shanghai) and Zhijun Yin (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method and a device of a 425 nm wavelength reference construction based on fluorescence-induced effect...