US Patent Issued to TOKYO WELD on July 14 for "Inspection apparatus and inspection method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,109, issued on July 14, was assigned to TOKYO WELD Co. LTD. (Tokyo-To, Japan).

"Inspection apparatus and inspection method" was invented by Shunsuke Sasaki (Tokyo-to, Japan), Taiyo Komori (Tokyo-to, Japan) and Yoshikazu Sasaoka (Tokyo-to, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes: a voltage application unit that applies voltage to a capacitor to perform charging; a current measurement unit that continuously measures current of the capacitor during the charging; and an anomaly detection unit that detects an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of t...