US Patent Issued to TOHOKU UNIVERSITY on Sept. 22 for "Spectroscopic device, spectroscopic method, Raman scattering analysis device, luminescence spectroscopic analysis device, and harmonic observation device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,682, issued on Sept. 22, was assigned to TOHOKU UNIVERSITY (Sendai, Japan).

"Spectroscopic device, spectroscopic method, Raman scattering analysis device, luminescence spectroscopic analysis device, and harmonic observation device" was invented by Shinichiro Iwai (Sendai, Japan) and Yohei Kawakami (Sendai, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A spectroscopic device according to the present disclosure includes: a light source unit configured to output signal light generated from a sample; a Fourier spectroscopic unit configured to receive the signal light, generate a pair of light beams with any time delay, and output first output li...