US Patent Issued to Thermo Electron Scientific Instruments on April 21 for "Optical extraction probe for electron microscope and other vacuum chambers" (Wisconsin, Ohio Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,582, issued on April 21, was assigned to Thermo Electron Scientific Instruments LLC (Madison, Wis.).

"Optical extraction probe for electron microscope and other vacuum chambers" was invented by Francis Deck (Madison, Wis.) and Justin Morrow (Cincinnati).

According to the abstract* released by the U.S. Patent & Trademark Office: "A beam extraction system is provided. The beam extraction system includes a first focusing optic, a second focusing optic, and an optic relay coupled to the first focusing optic and the second focusing optic. The first focusing optic is configured to form a light beam from light collected from a sample positioned at a focal point of the first focusing op...