ALEXANDRIA, Va., April 7 -- United States Patent no. D1,121,838, issued on April 7, was assigned to The University of Hong Kong (Hong Kong).
"Multiplex rapid antigen test hub" was invented by Ho Fun Victor Lee (Hong Kong) and Ka Chun Wu (Hong Kong).
The patent was filed on Oct. 11, 2024, under Application No. D/967,715.
*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1121838&OS=D1121838&RS=D1121838
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