US Patent Issued to The United States of America as represented by the Secretary of the Navy on June 9 for "Deep learning-based autofocus improvement metric for synthetic aperture sonar and synthetic aperture radar" (Florida Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,325, issued on June 9, was assigned to The United States of America as represented by the Secretary of the Navy.

"Deep learning-based autofocus improvement metric for synthetic aperture sonar and synthetic aperture radar" was invented by Jeffrey J Dale (Lynn Haven, Fla.), Matthew S Emigh (Panama City Beach, Fla.) and James L Prater Jr. (Lynn Haven, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deep learning-based system and method for determining whether an autofocus algorithm has improved or degraded the image quality of a snippet derived from a synthetic aperture sonar system or a synthetic aperture radar system. The deep learning-based sys...