US Patent Issued to The Regents of the University of California on July 14 for "Methods for collecting electron diffraction patterns" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,969, issued on July 14, was assigned to The Regents of the University of California (Oakland, Calif.).

"Methods for collecting electron diffraction patterns" was invented by Tamir Gonen (Los Angeles), Michael Martynowycz (Los Angeles) and Johan Hattne (Los Angeles).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods of collecting diffraction patterns from a microcrystal having an ordered array of a molecule are disclosed, which include using an exposure rate of at most 0.02 electrons per square angstrom per second on the microcrystal and using a direct electron detector to record electron diffraction patterns. Also disclosed are methods of determi...