US Patent Issued to The Hong Kong University of Science and Technology, Board of Regents, The University of Texas System on Sept. 8 for "Prism-free differential interference contrast microscope with tunable beam shear distance" (Chinese, American Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,010, issued on Sept. 8, was assigned to The Hong Kong University of Science and Technology (Hong Kong) and Board of Regents, The University of Texas System (Richardson, Texas).

"Prism-free differential interference contrast microscope with tunable beam shear distance" was invented by Ka Hung Chan (Hong Kong), Xian Chen (Hong Kong), Zhuohui Zeng (Hong Kong) and Shengwang Du (Richardson, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pair of light rays spatially-sheared with a controllable beam-shear distance is generated by a module having a beamsplitter (BS) and two mirrors. The BS splits an input light ray into first and second split light ...