US Patent Issued to THE BOEING on Sept. 1 for "Microspot reflectometer" (Missouri Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,980, issued on Sept. 1, was assigned to THE BOEING COMPANY (Arlington, Va.).

"Microspot reflectometer" was invented by Brian Gunther (St. Louis), James Thaddeus Wegner (St. Louis) and Jeffery Thomas Murphy (Troy, Mo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A reflectometer configured to test a sample. The reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. The reflectometer focuses the light beam to a reduced spot size on the sample. The reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample."

The patent was filed on Apr...