US Patent Issued to TEXAS INSTRUMENTS on May 19 for "Light scattering measurement based on multiple light sources" (Texas Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,538, issued on May 19, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Light scattering measurement based on multiple light sources" was invented by Kaichien Tsai (Allen, Texas), Boyu Shen (McKinney, Texas) and Zhongyan Sheng (Allen, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are described herein for air quality sensing. In some examples, the techniques are implemented as an apparatus including first and second light sources, a light detector having a detector output, and a processing circuit having a processing input coupled to the detector output and a processing output. The first light source is configured to generate a firs...