US Patent Issued to TEXAS INSTRUMENTS on July 14 for "Procedure for making on-die-parametric measurements of circuit devices" (Texas Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,078, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Procedure for making on-die-parametric measurements of circuit devices" was invented by Jordan Wenske (Richardson, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test structure for testing the on-die-parametric (ODP) measurements of circuit devices on a die. When no circuit devices are connected to the test structure, the test structure is configured to supply an input voltage at an input node of the test structure. While supplying the input voltage, the test structure determines a first measure of current at the input node and a first measure of voltage at an output n...