US Patent Issued to TEXAS INSTRUMENTS on Aug. 18 for "Thermal test chip with stackable metal based heater and sensor" (California, Texas Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,713,918, issued on Aug. 18, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"Thermal test chip with stackable metal based heater and sensor" was invented by Vinod Rai (San Jose, Calif.), Archana Venugopal (Mountain View, Calif.) and Blake Travis (Richardson, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device includes a package structure, conductive leads partially exposed outside the package structure, and a semiconductor die having a semiconductor layer and a multilevel metallization structure, where the semiconductor die is enclosed by the package structure and the multilevel metallization structure includes a heater resistor, ...