US Patent Issued to Testmetrix on Feb. 17 for "Apparatus and method for testing semiconductor devices" (Romanian, American Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,945, issued on Feb. 17, was assigned to Testmetrix Inc. (San Jose, Calif.).

"Apparatus and method for testing semiconductor devices" was invented by Christian O. Cojocneanu (Milpitas, Calif.) and Lucian Scurtu (Codlea Brasov, Romania).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention is a test system for testing silicon wafers or packaged devices. The system includes a tester having multiple testing stacks that each hold a vertical stack of test engines, data buffers, pin drivers, and other resources, which are electrically connected on one side to a wafer or DUT and on the other side to a test host computer via fast data links. Each testi...