US Patent Issued to Teledyne FLIR Commercial Systems on April 14 for "Multi-etch detector pixels fabrication and associated imaging systems and methods" (California Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,542, issued on April 14, was assigned to Teledyne FLIR Commercial Systems Inc. (Goleta, Calif.).

"Multi-etch detector pixels fabrication and associated imaging systems and methods" was invented by Edward K. Huang (Newbury Park, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are disclosed for facilitating multi-etch detector pixels fabrication. In one example, a method includes forming a semiconductor structure. The semiconductor structure includes a substrate layer, an absorber layer disposed on the substrate layer, a barrier layer disposed on the absorber layer, and a first contact layer disposed on the barrier layer. The method ...