US Patent Issued to Tektronix on June 23 for "Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip" (Indian Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,044, issued on June 23, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip" was invented by Swapnil Jhawar (Rewa, India), Chandra Sekhar Kappagantu (Bangalore, India), Mahesha Guttahalli Lakshmipathy (Bengaluru, India) and Sriram Mandyam Krishnakumar (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test ...