US Patent Issued to Tektronix on July 28 for "Runtime data collection and monitoring in machine learning systems" (Canadian, American Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,658, issued on July 28, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Runtime data collection and monitoring in machine learning systems" was invented by Wenzheng Sun (Mississauga, Canada), Evan Douglas Smith (Portland, Ore.) and John J. Pickerd (Hillsboro, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: coll...