US Patent Issued to TECHWIDU on Sept. 8 for "Test circuit having separately arranged digital and analog circuits for testing a device under test" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,145, issued on Sept. 8, was assigned to TECHWIDU Co. LTD. (Suwon-si, South Korea).

"Test circuit having separately arranged digital and analog circuits for testing a device under test" was invented by Hyoung-Rae Kim (Hwaseong-si, South Korea), Dong-Yul Lee (Suwon-si, South Korea) and Jun-Hyung Ha (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a test circuit configured to receive an inspection command from automatic test equipment (ATE) and test a device under test (DUT), and the test circuit includes a plurality of analog inspection circuits electrically connected to the DUT to test an operation thereof, and a dig...