US Patent Issued to Technische Universitat Munchen on Aug. 11 for "Parallelized probing of a plurality of samples in a self-organized structure" (German Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,500, issued on Aug. 11, was assigned to Technische Universitat Munchen (Munich).

"Parallelized probing of a plurality of samples in a self-organized structure" was invented by Dominik Bucher (Puchheim, Germany), Robin Derek Allert (Eching, Germany) and Andreas Deeg (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a method for parallelized probing of a plurality of samples, a sensor chip for parallelized probing of a plurality of samples, a sensing device for parallelized probing of a plurality of samples, and a measurement system for parallelized probing of a plurality of samples. The method comprises providing a sensor chi...