ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,910, issued on Oct. 20, was assigned to TDK Corp. (Tokyo).
"Measurement device" was invented by Yu Hotta (Tokyo) and Kensuke Sekihara (Hachioji, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device includes a signal sensor unit having one or more signal sensors configured to measure a measurement signal in which a target signal and noise are mixed, a reference sensor unit having two or more reference sensors configured to measure a reference signal including the noise, and a processing unit. The processing unit includes a reference sensor data group unit configured to classify reference sensor data that is data of two or more re...