ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,524, issued on April 14, was assigned to TCL China Star Optoelectronics Technology Co. Ltd. (Shenzhen, China).
"Method of calculating intensity of light leakage" was invented by Chuanghua Deng (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a method of calculating an intensity of light leakage by extracting geometric design parameters of a curved display device and establishing a finite element model according to the geometric design parameters. The finite element model is subjected to bending deformation, and according to an obtained stress and a conversion relationship, a complex amplitude matrix and...