ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,079, issued on Sept. 1, was assigned to TATA CONSULTANCY SERVICES Ltd. (Mumbai, India).
"Methods and systems for high resolution and scalable crop yield forecasting" was invented by Jayantrao Mohite (Thane, India), Suryakant Ashok Sawant (Thane, India), Rishabh Agarwal (Thane, India), Ankur Pandit (Thane, India) and Srinivasu Pappula (Hyderabad, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure relates to methods and systems for high resolution and scalable crop yield forecasting by first developing a first crop yield forecasting model to generate coarse resolution yield maps and further dynamically selecting a set of pixels from ...