US Patent Issued to Taiwan Semiconductor Manufacturing on Sept. 22 for "Using built-in self test or test results to identify weak memory bits and enable assist circuits when necessary" (Taiwanese Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,744,098, issued on Sept. 22, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Using built-in self test or test results to identify weak memory bits and enable assist circuits when necessary" was invented by Cormac Michael O'Connell (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device and a method of operating the semiconductor device and circuit are disclosed. In one aspect, the semiconductor device includes a memory array comprising a first memory cell and a second memory cell. The second memory cell has an operational characteristic different than that of the first memory cell. The semi...