US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Oct. 27 for "Time-dependent dielectric breakdown (TDDB) test unit, measurement circuit and method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,041, issued on Oct. 27, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Time-dependent dielectric breakdown (TDDB) test unit, measurement circuit and method thereof" was invented by Kuo-Yu Chou (Hsinchu City, Taiwan) and Chi-Hung Lo (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement circuit is provided. The measurement circuit includes an array including a plurality of test units arranged in rows and columns. Each test unit includes a device under test, a first control circuit and a second control circuit. The first control circuit is operable in the first power domain correspondi...