US Patent Issued to Taiwan Semiconductor Manufacturing on Oct. 27 for "Testing system and testing method of using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,024, issued on Oct. 27, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Testing system and testing method of using the same" was invented by Kuan Chun Chen (Hsinchu City, Taiwan), Shu An Shang (Kaohsiung City, Taiwan), Guang-Sing Huang (Hsinchu County, Taiwan), Kai-Yi Tang (New Taipei City, Taiwan) and Hsiou-Yu He (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a testing system and a testing method of using the same. The testing system includes a probe card for testing a device under test (DUT). The probe card includes: a space transformer; a circuit board over a first surface of the space ...