US Patent Issued to Taiwan Semiconductor Manufacturing on May 5 for "Integrated circuit device facilitating same-side optical and electrical testing" (Taiwanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,619,037, issued on May 5, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Integrated circuit device facilitating same-side optical and electrical testing" was invented by Xin-Hua Huang (Xihu Township, Taiwan), Kuo-Hao Lee (Hsinchu, Taiwan), Jung-Kuo Tu (Hsinchu City, Taiwan), Kejun Xia (Hsinchu City, Taiwan) and Tse-En Chang (Hsinchu City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Some embodiments relate to an integrated circuit (IC) device that includes a first substrate including an optical lens at a frontside surface of the first substrate, an electrical IC structure disposed proximate a backside surface of t...